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IJCSE IJCSE-V12I6P102

This research uses a custom-generated dataset to implement the K-Nearest Neighbors (KNN) algorithm for flower classifica...

Prit Senjaliya, Khushi Prajapati, Avani Vagadiya
IJME IJME-V12I6P106

Lean manufacturing is an assessment method that assesses productivity and eliminates inefficiency. Manufacturers employ...

Niranjan S, Chandrasekaran. M
IJME IJME-V12I6P105

The present in vitro study aimed to analyze the mechanical (flexural and Microhardness) and optical (color stability) pr...

Karen Zafra-Ubillus, Kelly Achachao-Almerco, Sandra Pastor-Arenas, Jorge Infantes-Vargas, Oscar Alcázar-Aguilar, Alicia Alva-Mantari, Gina León-Untiveros
IJME IJME-V12I6P104

As processes become more complex, measuring them using key KPI indicators, such as Overall Equipment Effectiveness (OEE)...

Rolando Gonzales-Vera, Karol Rodriguez-Barrientos, Percy Castro-Rangel, José C. Alvarez, Robert Lepore
IJME IJME-V12I6P103

Densified biofuels are increasingly vital for renewable energy systems due to their high energy density and homogeneity....

Albert Jorddy Valenzuela Inga, Carlos Javier Huaman Albino, Heydi Karina Hinostroza Maravi, Boris Senin Carhuallanqui Parian
IJME IJME-V12I6P102

A wheel hub bearing could suffer damage from impacts during operation. The speed at which the vehicle strikes the pothol...

S D Rasika Perera
IJME IJME-V12I6P101

Any structure with the presence of a crack is responsive to collapse due to a change in dynamic behaviour as the crack i...

Malay Quila
IJEEE IJEEE-V12I6P120

Black ice is a serious road safety hazard, especially in cold and high-altitude areas, as it often forms silently and in...

Vishant Kumar, Rajesh Singh, Anita Gehlot, Sanjeev Kumar Shah, Roosha Shamoon
IJEEE IJEEE-V12I6P119

This project proposes an electronic control solution to improve thermal management during the electroplating process in...

Julio Andre Ramirez Ramirez, Dennis Benjamin Montalvo Hurtado, Alexander Hilario-Tacuri
IJEEE IJEEE-V12I6P118

The growing prevalence of portable electronic devices has led to an increased reliance on static random-access memory (S...

Ajjay S. Gaadhe, Yuvraj V. Parkale