Applicability of Various EOS in Modeling the Pressure Dependence of the Volume Thermal Expansion Coefficient of Nanomaterials

International Journal of Applied Physics

© 2025 by SSRG - IJAP Journal

Volume 12 Issue 3

Year of Publication : 2025

Authors : Rajendra K. Mishra, Om Prakash Gupta

10.14445/23500301/IJAP-V12I3P101

How to Cite?

Rajendra K. Mishra, Om Prakash Gupta, "Applicability of Various EOS in Modeling the Pressure Dependence of the Volume Thermal Expansion Coefficient of Nanomaterials," SSRG International Journal of Applied Physics, vol. 12,  no. 3, pp. 1-5, 2025. Crossref, https://doi.org/10.14445/23500301/IJAP-V12I3P101

Abstract:

There is a great deal of scientific and technological interest in the mechanical and thermal behavior of nanomaterials under high-pressure compression situations. The volume thermal expansion coefficient, which is sensitive to changes in both temperature and pressure, is one of the main factors controlling this behavior. This study investigates the modeling of the pressure dependence of the volume thermal expansion coefficient in nanomaterials using several Equations of State (EOS), including the Murnaghan, Tait, Suzuki, and Shanker equations. The study evaluates each EOS's capacity to capture nanoscale phenomena such as surface tension and quantum confinement by comparing theoretical, experimental, and simulation data. According to the results, Suzuki EOS works best at lower pressures, whereas Murnaghan functions better at higher pressures. The study emphasizes the importance of selecting the appropriate EOS based on the material type and pressure range. It also indicates that modified or hybrid models are required for precise thermophysical predictions in applications including nanotechnology.

Keywords:

Equation of State (EOS), Empirical, High Pressure Behavior, Material modeling, Volume Thermal Expansion Coefficient (VTEC).

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